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Infrared ellipsomet...
Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN
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- Schöche, Stefan (author)
- Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, U.S.A.
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- Hofmann, Tino (author)
- Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, U.S.A.
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- Sedrine, Nebiha Ben (author)
- Instituto Tecnológico e Nuclear, Sacavém, Portugal
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- Darakchieva, Vanja (author)
- Linköpings universitet,Halvledarmaterial,Tekniska högskolan
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- Wang, Xinqiang (author)
- State Key Lab of Artificial Microstructure and Mesoscopic Physics, Peking University, Beijing, China
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- Yoshikawa, Akihiko (author)
- Graduate School of Electrical and Electronics Engineering, Venture Business Laboratory, Chiba University, Chiba, Japan
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- Schubert, Mathias (author)
- Instituto Tecnológico e Nuclear, Sacavém, Portugal
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Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, US.A. Instituto Tecnológico e Nuclear, Sacavém, Portugal (creator_code:org_t)
- 2012-01-16
- 2012
- English.
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In: MRS Proceedings Volume 1396. - : Springer Science and Business Media LLC. ; , s. o07-27
- Related links:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Subject headings
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- We apply infrared spectroscopic ellipsometry (IRSE) in combination with near-infrared to vacuum-ultraviolet ellipsometry to study the concentration and mobility of holes in a set of Mg-doped In-polar InN samples of different Mg-concentrations. P-type behavior is found in the IRSE spectra for Mg-concentrations between 1x1018 cm-3 and 3x1019 cm-3. The free-charge carrier parameters are determined using a parameterized model that accounts for phonon-plasmon coupling. From the NIR-VUV data information about layer thicknesses, surface roughness, and structural InN layer properties are extracted and related to the IRSE results.
Keyword
- nitride; electron-phonon interactions; optical properties
Publication and Content Type
- ref (subject category)
- kon (subject category)
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