Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN

Schöche, StefanDepartment of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, U.S.A. (author)

We apply infrared spectroscopic ellipsometry (IRSE) in combination with near-infrared to vacuum-ultraviolet ellipsometry to study the concentration and mobility of holes in a set of Mg-doped In-polar InN samples of different Mg-concentrations. P-type behavior is found in the IRSE spectra for Mg-concentrations between 1x1018 cm-3 and 3x1019 cm-3. The free-charge carrier parameters are determined using a parameterized model that accounts for phonon-plasmon coupling. From the NIR-VUV data information about layer thicknesses, surface roughness, and structural InN layer properties are extracted and related to the IRSE results.

Hofmann, TinoDepartment of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, U.S.A. (author)
Sedrine, Nebiha BenInstituto Tecnológico e Nuclear, Sacavém, Portugal (author)
Darakchieva, VanjaLinköpings universitet,Halvledarmaterial,Tekniska högskolan(Swepub:liu)vanda79 (author)
Wang, XinqiangState Key Lab of Artificial Microstructure and Mesoscopic Physics, Peking University, Beijing, China (author)
Yoshikawa, AkihikoGraduate School of Electrical and Electronics Engineering, Venture Business Laboratory, Chiba University, Chiba, Japan (author)
Schubert, MathiasInstituto Tecnológico e Nuclear, Sacavém, Portugal (author)
Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, U.S.A.Instituto Tecnológico e Nuclear, Sacavém, Portugal (creator_code:org_t)

In:MRS Proceedings Volume 1396: Springer Science and Business Media LLC, s. o07-27
In:MRS Proceedings: Springer Science and Business Media LLC, s. o07-270272-91721946-4274

By the author/editor: Schöche, Stefan; Hofmann, Tino; Sedrine, Nebiha ...; Darakchieva, Van ...; Wang, Xinqiang; Yoshikawa, Akihi ...; show more...; Schubert, Mathia ...; show less...

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