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The complex impact of silicon and oxygen on the n-type conductivity of high-Al-content AlGaN

Kakanakova-Georgieva, Anelia (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Nilsson, Daniel (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Trinh, Xuan Thang (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
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Forsberg, Urban (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Nguyen, Son Tien (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Janzén, Erik (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
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 (creator_code:org_t)
AIP Publishing, 2013
2013
English.
In: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 102:13, s. 132113-
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • Issues of major relevance to the n-type conductivity of Al0.77Ga0.23N associated with Si and O incorporation, their shallow donor or deep donor level behavior, and carrier compensation are elucidated by allying (i) study of Si and O incorporation kinetics at high process temperature and low growth rate, and (ii) electron paramagnetic resonance measurements. The Al0.77Ga0.23N composition correlates to that Al content for which a drastic reduction of the conductivity of AlxGa1−xN is commonly reported. We note the incorporation of carbon, the role of which for the transport properties of AlxGa1−xN has not been widely discussed.

Keyword

aluminium compounds
electrical conductivity
gallium compounds
III-V semiconductors
impurity states
oxygen
paramagnetic resonance
silicon
wide band gap semiconductors

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ref (subject category)
art (subject category)

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