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Phase Evolution of Multilayered Al/Cu/Co Thin Films into Decagonal Al-Cu-Co and Al-Cu-Co-Si Quasicrystalline Phases

Olsson, Simon (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
Garbrecht, Magnus (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
Birch, Jens (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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Hultman, Lars (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
Eriksson, Fredrik (author)
Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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 (creator_code:org_t)
2013
English.
  • Other publication (other academic/artistic)
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  • Multilayered Al/Cu/Co thin films have been prepared by magnetron sputtering on Al2O3(0001) and Si(001) substrates and the phase evolution has been investigated. The decagonal d-Al-Cu-Co and d-Al-Cu-Co-Si phases were found to form at 500 °C, and at 600 °C these were the only phases. At increasing temperatures, the quasicrystals grew larger in size, up to 500 nm, although always smaller for the d-Al-Cu-Co-Si, and obtained a texturing with the 10-fold periodic axis aligned with the substrate normal. The d-Al-Cu-Co phase persisted to more than 850 °C, with a complete texturing, while the d-Al-Cu-Co-Si phase was replaced by other crystalline phases at 800 °C.

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TECHNOLOGY
TEKNIKVETENSKAP

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