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Scattered ultrasoun...
Scattered ultrasound fields measured by scanning laser vibrometry
- Article/chapterEnglish2003
Publisher, publication year, extent ...
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Bellingham, Wash.SPIE - International Society for Optical Engineering,2003
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Numbers
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LIBRIS-ID:oai:DiVA.org:ltu-31585
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https://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-31585URI
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https://doi.org/10.1117/12.500398DOI
Supplementary language notes
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Language:English
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Summary in:English
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Subject category:ref swepub-contenttype
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Subject category:kon swepub-publicationtype
Notes
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Validerad; 2003; 20120123 (ysko)
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A scanning laser Doppler vibrometer is used to make quantitative measurements of 2D ultrasound fields in air. The laser light traverses the measurement volume to and from a rigid reflector and determines the velocity of the change in optical path length, which with constant geometry only depends on the changes in index of refraction. Assuming adiabatic conditions, the refractive index rate is proportional to the sound pressure rate and quantitative measures of the sound field are possible to achieve. The emitted or scattered ultrasound being measured origins from a source or object outside the recording area. Using phase conjugation the sound field is then digitally reconstructed outside the recording area, and the reconstructed phase and intensity reveals the location of the source or object. The combination of several such reconstructions of ultrasound fields of different wavelengths, so called wavelength scanning, provides an intensity map that very accurately gives the position of the source. This opens many new possibilities to study hidden or unknown sound sources or scattering objects
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Molin, Nils-Erik
(author)
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Sjödahl, MikaelLuleå tekniska universitet,Strömningslära och experimentell mekanik(Swepub:ltu)mike
(author)
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Zipser, LotharHTW, Hochschule für Technik und Wirtschaft, Dresden
(author)
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Franke, HeinzHTW, Hochschule für Technik und Wirtschaft, Dresden
(author)
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Luleå tekniska universitetStrömningslära och experimentell mekanik
(creator_code:org_t)
Related titles
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In:Optical Measurement Systems for Industrial Inspection IIIBellingham, Wash. : SPIE - International Society for Optical Engineering, s. 717-727819450146
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