Component Testing is Not Enough - A Study of Software Faults in Telecom Middleware

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Eldh, SigridMälardalens högskola,Institutionen för datavetenskap och elektronik (author)

Component Testing is Not Enough - A Study of Software Faults in Telecom Middleware

Article/chapterEnglish2007

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Berlin, Heidelberg :Springer,2007
printrdacarrier

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LIBRIS-ID:oai:DiVA.org:mdh-4146
https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-4146URI
https://doi.org/10.1007/978-3-540-73066-8_6DOI
https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-7016URI

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Language:English
Summary in:English

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Subject category:kap swepub-publicationtype

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19th IFIP TC6/WG6.1 International Conference on Testing of Communicating Systems, Testcom 2007, and 7th International Workshop on Formal Approaches to Testing Software, FATES 2007; Tallinn ;26 June 2007 through 29 June 2007
The interrelationship between software faults and failures is quite intricate and obtaining a meaningful characterization of it would definitely help the testing community in deciding on efficient and effective test strategies. Towards this objective, we have investigated and classified failures observed in a large complex telecommunication industry middleware system during 2003-2006. In this paper, we describe the process used in our study for tracking faults from failures along with the details of failure data. We present the distribution and frequency of the failures along with some interesting findings unravelled while analyzing the origins of these failures. Firstly, though "simple" faults happen, together they account for only less than 10%. The majority of faults come from either missing code or path, or superfluous code, which are all faults that manifest themselves for the first time at integration/system level; not at component level. These faults are more frequent in the early versions of the software, and could very well be attributed to the difficulties in comprehending and specifying the context (and adjacent code) and its dependencies well enough, in a large complex system with time to market pressures. This exposes the limitations of component testing in such complex systems and underlines the need for allocating more resources for higher level integration and system testing.

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Punnekkat, SasikumarMälardalens högskola,Institutionen för datavetenskap och elektronik(Swepub:mdh)spt01 (author)
Hansson, HansMälardalens högskola,Institutionen för datavetenskap och elektronik(Swepub:mdh)hhn02 (author)
Jönsson, PeterMälardalens högskola,Institutionen för datavetenskap och elektronik (author)
Mälardalens högskolaInstitutionen för datavetenskap och elektronik (creator_code:org_t)

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In:Lecture Notes in Computer Science, vol. 4581Berlin, Heidelberg : Springer, s. 74-899783540730651

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By the author/editor: Eldh, Sigrid; Punnekkat, Sasik ...; Hansson, Hans; Jönsson, Peter

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ENGINEERING AND TECHNOLOGY: ENGINEERING AND ...; and Electrical Engin ...; and Computer Systems

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