Analysis and Improvement of Resilience for Long Short-Term Memory Neural Networks

• The reliability of Artificial Neural Networks (ANNs) has emerged as a prominent research topic due to their increasing utilization in safety-critical applications. Long Short-Term Memory (LSTM) ANNs have demonstrated significant advantages in healthcare applications, primarily attributed to their robust processing of time-series data and memory-facilitated capabilities. This paper, for the first time, presents a comprehensive and fine-grain analysis of the resilience of LSTM-based ANNs in the context of gait analysis using fault injection into weights. Additionally, we improve their resilience by replacing faulty weights with zero, enabling ANNs to withstand environments that are up to 20 times harsher while experiencing up to 7 times fewer critical faults than an unprotected ANN.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

Brain

Safety engineering

Fault injection

Fine-grain analysis

Health care application

Neural-networks

Research topics

Robust processing

Safety critical applications

Time-series data

Long short-term memory

Publication and Content Type

ref (subject category)

kon (subject category)