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Reliability investi...
Reliability investigation on SiC BJT power module
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- Otto, Alexander (author)
- Fraunhofer ENAS, Germany
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- Kaulfersch, Eberhard (author)
- Berliner Nanotest und Design GmbH, Germany
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- Frankeser, Sophia (author)
- Chemnitz University of Technology, Germany
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- Brinkfeldt, Klas (author)
- RISE,IVF
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- Zschieschang, Olaf (author)
- Fairchild Semiconductor GmbH, Germany
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- Rzepka, Sven (author)
- Fraunhofer ENAS, Germany
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(creator_code:org_t)
- Institute of Electrical and Electronics Engineers Inc. 2016
- 2016
- English.
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In: PCIM Europe 2016. - : Institute of Electrical and Electronics Engineers Inc.. - 9783800741861 ; , s. 1063-1071
- Related links:
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https://urn.kb.se/re...
Abstract
Subject headings
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- In this paper reliability investigation results for a power module fully based on silicon carbide (SiC) devices are presented. The module comprises four SiC bipolar junction transistors (BJT) and four SiC diodes in half-bridge configuration and is part of a newly developed 3-phase inverter for construction vehicles as well as for passenger car applications. The reliability investigations include electro-thermal and thermo-mechanical finite element simulations as well as power cycling tests with subsequent failure analyses. Furthermore, a double-sided cooling approach for the SiC BJT power module will be described and its thermal performance compared to the single-sided cooling version.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Keyword
- Bridges
- Electric power systems
- Energy management
- Finite element method
- Intelligent robots
- Power electronics
- Reliability
- Silicon carbide
- Construction vehicle
- Double-sided cooling
- Finite element simulations
- Reliability investigations
- SiC bipolar junction transistors
- Silicon carbides (SiC)
- Thermal Performance
- Thermo-mechanical
- Bipolar transistors
Publication and Content Type
- ref (subject category)
- kon (subject category)
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