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Design optimization of a high temperature 1.2 kV 4H-SiC buried grid JBS rectifier

Elahipanah, Hossein (author)
KTH,Integrerade komponenter och kretsar,Ascatron AB, Sweden
Thierry-Jebali, N. (author)
Ascatron AB, Sweden
Reshanov, S. A. (author)
Ascatron AB, Sweden
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Kaplan, W. (author)
Ascatron AB, Sweden
Zhang, A. (author)
Ascatron AB, Sweden
Lim, Jang-Kwon (author)
RISE,Acreo
Bakowski, Mietek (author)
RISE,Acreo
Östling, Mikael (author)
KTH,Integrerade komponenter och kretsar,KTH Royal Institute of Technology, Sweden
Schöner, A. (author)
Ascatron AB, Sweden
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 (creator_code:org_t)
Trans Tech Publications Inc. 2017
2017
English.
In: 11th European Conference on Silicon Carbide and Related Materials, ECSCRM 2016. - : Trans Tech Publications Inc.. - 9783035710434 ; , s. 455-458
  • Conference paper (peer-reviewed)
Abstract Subject headings
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  • 1.2 kV SiC buried grid junction barrier Schottky (BG-JBS) diodes are demonstrated. The design considerations for high temperature applications are investigated. The design is optimized in terms of doping concentration and thickness of the epilayers, as well as grid size and spacing dimensions, in order to obtain low on-resistance and reasonable leakage current even at high temperatures. The device behavior at temperatures ranging from 25 to 250ºC is analyzed and measured on wafer level. The forward voltage drop of 1.1 V at 100 A/cm2 and 3.8 V at 1000 A/cm2 is measured, respectively. At reverse voltage of 1 kV, a leakage current density below 0.1 μA/cm2 and below 0.1 mA/cm2 is measured at 25 and 250ºC, respectively. This proves the effective shielding effect of the BG-JBS design and provides benefits in high voltage applications, particularly for high temperature operation.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Keyword

Buried grid
High temperature
High voltage
Junction barrier Schottky (JBS)
Silicon carbide (SiC)
High temperature applications
High temperature operations
Rectifying circuits
Schottky barrier diodes
Semiconductor junctions
Silicon
Silicon carbide
Silicon wafers
Junction Barrier Schottky
Silicon carbides (SiC)
Power semiconductor diodes

Publication and Content Type

ref (subject category)
kon (subject category)

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