Characterizing Grain-Oriented Silicon Steel Sheet Using Automated High-Resolution Laue X-ray Diffraction

• Controlling texture in grain-oriented (GO) silicon steel sheet is critical for optimization of its magnetization performance. A new automated laboratory system, based on X-ray Laue diffraction, is introduced as a rapid method for large scale grain orientation mapping and texture measurement in these materials. Wide area grain orientation maps are demonstrated for both macroetched and coated GO steel sheets. The large secondary grains contain uniform lattice rotations, the origins of which are discussed.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Materialteknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Materials Engineering (hsv//eng)

Keyword

Silicon steel

Steel sheet

Automated laboratory system

Grain orientation

Grain oriented silicon steel sheet

Grain-oriented silicon steel

High resolution

Lattice rotations

Laue diffraction

Texture measurement

X ray diffraction

Publication and Content Type

ref (subject category)

art (subject category)