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  • Andersson, Bengt OlofRISE,SP – Sveriges Tekniska Forskningsinstitut (author)

The reference step method for DC voltage at 1 mV and 10 mV

  • Article/chapterEnglish2014

Publisher, publication year, extent ...

  • Institute of Electrical and Electronics Engineers Inc.2014
  • printrdacarrier

Numbers

  • LIBRIS-ID:oai:DiVA.org:ri-46527
  • https://urn.kb.se/resolve?urn=urn:nbn:se:ri:diva-46527URI
  • https://doi.org/10.1109/CPEM.2014.6898488DOI

Supplementary language notes

  • Language:English
  • Summary in:English

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Classification

  • Subject category:ref swepub-contenttype
  • Subject category:kon swepub-publicationtype

Notes

  • We have investigated the performance of a method called the Reference Step Method at low voltage levels. The method has been evaluated earlier at voltage levels from 0.1 V to 1 kV with excellent results. The advantages of this method are that it uses commonly available equipment and can be fully automated. We have made comparisons with three other low-voltage methods and the differences show that the uncertainties can be less than 30 μV/V at 1 mV and 3 μV/V at 10 mV, making it possible to use this method to perform automated calibration of calibrators with sufficient accuracy for calibration of high-end instruments.

Subject headings and genre

  • dc range calibrators
  • dc voltage build-up
  • DC voltage ratio
  • dc voltage scale
  • low voltage measurements
  • DC voltage
  • Step method

Added entries (persons, corporate bodies, meetings, titles ...)

  • Early, Murray D.Measurement Standards Laboratory of New Zealand, New Zealand (author)
  • Eklund, GunnarRISE,SP – Sveriges Tekniska Forskningsinstitut(Swepub:ri)gunnare@ri.se (author)
  • Gunnarsson, OveRISE,SP – Sveriges Tekniska Forskningsinstitut (author)
  • Rydler, Karl-ErikRISE,SP – Sveriges Tekniska Forskningsinstitut(Swepub:ri)KarlER@ri.se (author)
  • RISESP – Sveriges Tekniska Forskningsinstitut (creator_code:org_t)

Related titles

  • In:CPEM Digest (Conference on Precision Electromagnetic Measurements): Institute of Electrical and Electronics Engineers Inc., s. 520-5219781479952052

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