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High-precision mass...
High-precision mass measurements for fundamental applications using highly-charged ions with SMILETRAP
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- Nagy, Sz (author)
- Stockholms universitet,Fysikum
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- Fritioff, T (author)
- Stockholms universitet,Fysikum
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- Bergström, I (author)
- Stockholms universitet,Manne Siegbahn-laboratoriet
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- Blaum, K (author)
- Stockholms universitet,Fysikum
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- Suhonen, M (author)
- Stockholms universitet,Fysikum
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- Schuch, R (author)
- Stockholms universitet,Fysikum
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(creator_code:org_t)
- 2007-03-16
- 2007
- English.
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In: Journal of Physics, Conference Series. - : IOP Publishing. - 1742-6588 .- 1742-6596. ; 58, s. 109-112
- Related links:
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http://urn.kb.se/res...
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https://doi.org/10.1...
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Abstract
Subject headings
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- The Penning trap mass spectrometer SMILETRAP takes advantage of highly-charged ions for high-accuracy mass measurements. In this paper recent mass measurements on Li and Ca ions are presented and their impact on fundamental applications discussed, especially the need for accurate mass values of hydrogen-like and lithium-like ions in the evaluation of the electron g-factor measurements in highly-charged ions is emphasized. Such experiments aim to test bound state quantum electrodynamics. Here the ionic mass is a key ingredient, which can be the limiting factor for the final precision.
Subject headings
- NATURVETENSKAP -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)
Keyword
- Atomic physics
- Atomfysik
Publication and Content Type
- ref (subject category)
- art (subject category)
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