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Thermal stability o...
Thermal stability of Ti3SiC2 thin films
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- Emmerlich, Jens (author)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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- Music, Denis (author)
- Materials Chemistry, RWTH Aachen University, Germany
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- Eklund, Per (author)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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- Wilhelmsson, Ola (author)
- Uppsala universitet,Oorganisk kemi,Department of Materials Chemistry, Uppsala University, Uppsala, Sweden
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- Jansson, Ulf (author)
- Uppsala universitet,Oorganisk kemi,Department of Materials Chemistry, Uppsala University, Uppsala, Sweden
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- Schneider, Jochen M. (author)
- Materials Chemistry, RWTH Aachen University, Germany
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- Högberg, Hans (author)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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- Hultman, Lars (author)
- Linköpings universitet,Tunnfilmsfysik,Tekniska högskolan
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(creator_code:org_t)
- Elsevier BV, 2007
- 2007
- English.
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In: Acta Materialia. - : Elsevier BV. - 1359-6454 .- 1873-2453. ; 55:4, s. 1479-1488
- Related links:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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https://urn.kb.se/re...
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Abstract
Subject headings
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- The thermal stability of Ti3SiC2(0 0 0 1) thin films is studied by in situ X-ray diffraction analysis during vacuum furnace annealing in combination with X-ray photoelectron spectroscopy, transmission electron microscopy and scanning transmission electron microscopy with energy dispersive X-ray analysis. The films are found to be stable during annealing at temperatures up to 1000 °C for 25 h. Annealing at 1100–1200 °C results in the rapid decomposition of Ti3SiC2 by Si out-diffusion along the basal planes via domain boundaries to the free surface with subsequent evaporation. As a consequence, the material shrinks by the relaxation of the Ti3C2 slabs and, it is proposed, by an in-diffusion of O into the empty Si-mirror planes. The phase transformation process is followed by the detwinning of the as-relaxed Ti3C2 slabs into (1 1 1)-oriented TiC0.67 layers, which begin recrystallizing at 1300 °C. Ab initio calculations are provided supporting the presented decomposition mechanisms.
Subject headings
- NATURVETENSKAP -- Kemi (hsv//swe)
- NATURAL SCIENCES -- Chemical Sciences (hsv//eng)
Keyword
- Ti3SiC2 thin films
- Phase transformations
- X-ray diffraction
- Transmission electron microscopy
- Ab initio electron theory
- Chemistry
- Kemi
- NATURAL SCIENCES
Publication and Content Type
- ref (subject category)
- art (subject category)
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