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A non-destructive d...
A non-destructive deep interface characterization technique for multilayer films
- Article/chapterEnglish2007
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LIBRIS-ID:oai:DiVA.org:uu-147299
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https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-147299URI
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
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Times Cited: 0 10th International Conference on Electronic Spectroscopy and Structure Aug 28-sep 01, 2006 Foz do Iguacu, BRAZIL
Added entries (persons, corporate bodies, meetings, titles ...)
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Karis, O.Uppsala universitet,Fysik V
(author)
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Svensson, S.Uppsala universitet,Fysik V(Swepub:uu)svansven
(author)
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Ohrwall, G.Uppsala universitet,Fysik V
(author)
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Andersson, G.
(author)
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Marcellini, M.
(author)
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Martensson, N.Uppsala universitet,Fysik V
(author)
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Olovsson, W.
(author)
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Holmstrom, E.
(author)
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Abrikosov, I. A.
(author)
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Niklasson, A. M. N.
(author)
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Johansson, B.
(author)
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Braun, W.
(author)
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Bressler, P.
(author)
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Schafers, E.
(author)
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Eberhardt, W.
(author)
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Uppsala universitetFysik V
(creator_code:org_t)
Related titles
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In:Journal of Electron Spectroscopy and Related Phenomena156, s. LII-LII0368-20481873-2526
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Gorgoi, M.
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Karis, O.
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Svensson, S.
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Ohrwall, G.
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Andersson, G.
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Marcellini, M.
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Martensson, N.
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Olovsson, W.
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Holmstrom, E.
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Abrikosov, I. A.
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Niklasson, A. M. ...
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Johansson, B.
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Braun, W.
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Bressler, P.
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Schafers, E.
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Eberhardt, W.
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Journal of Elect ...
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Uppsala University