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A simple TEM method for fast thickness characterization of suspendedgraphene flakes
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- Akhtar, Sultan (author)
- Uppsala universitet,Institutionen för teknikvetenskaper,Electron Microscopy and Nanoengineering
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- Rubino, Stefano (author)
- Uppsala universitet,Institutionen för teknikvetenskaper,Electron Microscopy and Nanoengineering
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- Leifer, Klaus (author)
- Uppsala universitet,Tillämpad materialvetenskap,Electron Microscopy and Nanoengineering
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- English.
- Other publication (other academic/artistic)
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Nanoteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Nano-technology (hsv//eng)
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
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- ovr (subject category)
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- Akhtar, Sultan
- Rubino, Stefano
- Leifer, Klaus
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- ENGINEERING AND TECHNOLOGY
- ENGINEERING AND ...
- and Nano technology
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- NATURAL SCIENCES
- and Physical Science ...
- and Condensed Matter ...
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- Uppsala University
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