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Quantitative assessment of EMCD signals in real and reciprocal space in single and multilayer samples
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- Leifer, Klaus (author)
- Uppsala universitet,Tillämpad materialvetenskap,Electron Microscopy and Nanoengineering
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- Rubino, Stefano (author)
- Uppsala universitet,Tillämpad materialvetenskap,Electron Microscopy and Nanoengineering
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- Rusz, Jan (author)
- Uppsala universitet,Materialteori
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- (creator_code:org_t)
- 2012
- 2012
- English.
- In: Proceedings of the 15th European Microscopy Congress: Volume 2: Physical Sciences: Tools and Techniques. - 9780950246369 ; , s. 727-728
- Conference paper (peer-reviewed)
Subject headings
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Nanoteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Nano-technology (hsv//eng)
- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
Keyword
- Nanoscale magnetism
- Superlattice
- Multilayer
- EMCD
- TEM
- Microscopy
- EELS
- Interface
- Teknisk fysik med inriktning mot nanoteknologi och funktionella material
- Engineering Science with specialization in Nanotechnology and Functional Materials
- Engineering Science with specialization in Materials Analysis
- Teknisk fysik med inriktning mot materialanalys
- Engineering Science with specialization in Materials Science
- Teknisk fysik med inriktning mot materialvetenskap
Publication and Content Type
- ref (subject category)
- kon (subject category)
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- Oppeneer, Peter
- Eriksson, Olle
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