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Morphological stability and specific resistivity of sub-10 nm silicide films of Ni1-xPtx on Si substrate
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- Zhen, Zhang, 1979- (author)
- Uppsala universitet,Fasta tillståndets elektronik
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- Zhang, Shi-Li (author)
- Uppsala universitet,Fasta tillståndets elektronik
- Yang, B. (author)
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- Zhu, Y. (author)
- Rossnagel, S. (author)
- Gaudet, S. (author)
- Kellock, A. (author)
- Jordan-Sweet, Jean (author)
- Lavoie, C. (author)
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- (creator_code:org_t)
- 2010
- 2010
- English.
- In: Applied Physics Letters. - 0003-6951 .- 1077-3118. ; 96, s. 071915-
- Journal article (peer-reviewed)
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