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Thermal stability o...
Thermal stability of photovoltaic a-Si:H determined by neutron reflectometry
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Qviller, A. J. (author)
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- Dennison, A. J. C. (author)
- Uppsala universitet,Materialfysik
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Haug, H. (author)
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You, C. C. (author)
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Hasle, I. M. (author)
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Ostreng, E. (author)
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Fjellvag, H. (author)
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- Vorobiev, Alexey (author)
- Uppsala universitet,Materialfysik
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- Hjörvarsson, Björgvin (author)
- Uppsala universitet,Materialfysik
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Marstein, E. S. (author)
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Frommen, C. (author)
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Hauback, B. C. (author)
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(creator_code:org_t)
- AIP Publishing, 2014
- 2014
- English.
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In: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 105:23, s. 231909-
- Related links:
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https://ife.brage.un...
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
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- Neutron and X-ray reflectometry were used to determine the layer structure and hydrogen content of thin films of amorphous silicon (a-Si:H) deposited onto crystalline silicon (Si) wafers for surface passivation in solar cells. The combination of these two reflectometry techniques is well suited for non-destructive probing of the structure of a-Si:H due to being able to probe buried interfaces and having sub-nanometer resolution. Neutron reflectometry is also unique in its ability to allow determination of density gradients of light elements such as hydrogen (H). The neutron scattering contrast between Si and H is strong, making it possible to determine the H concentration in the deposited a-Si:H. In order to correlate the surface passivation properties supplied by the a-Si:H thin films, as quantified by obtainable effective minority carrier lifetime, photoconductance measurements were also performed. It is shown that the minority carrier lifetime falls sharply when H has been desorbed from a-Si:H by annealing. (C) 2014 AIP Publishing LLC.
Subject headings
- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
Publication and Content Type
- ref (subject category)
- art (subject category)
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- By the author/editor
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Qviller, A. J.
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Dennison, A. J. ...
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Haug, H.
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You, C. C.
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Hasle, I. M.
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Ostreng, E.
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show more...
-
Fjellvag, H.
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Vorobiev, Alexey
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Hjörvarsson, Bjö ...
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Marstein, E. S.
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Frommen, C.
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Hauback, B. C.
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show less...
- About the subject
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- NATURAL SCIENCES
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NATURAL SCIENCES
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and Physical Science ...
- Articles in the publication
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Applied Physics ...
- By the university
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Uppsala University