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Influence of silico...
Influence of silicon-sapphire interface defects on SOS MESFET beavior
- Article/chapterEnglish1988
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LIBRIS-ID:oai:DiVA.org:uu-258272
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https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-258272URI
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Subject category:ref swepub-contenttype
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Subject category:art swepub-publicationtype
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Magnusson, U
(author)
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Rosling, M
(author)
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Tove, PAUppsala universitet,Fasta tillståndets elektronik
(author)
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Uppsala universitetFasta tillståndets elektronik
(creator_code:org_t)
Related titles
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In:Solid-State Electronics31:10, s. 1493-14960038-11011879-2405
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