Resonant x-ray diffraction revealing chemical disorder in sputtered L10 FeNi on Si(0 0 1)

• In the search for new rare earth free permanent magnetic materials, FeNi with a L1(0) structure is a possible candidate. We have synthesized the phase in the thin film form by sputtering onto HF-etched Si(001) substrates. Monatomic layers of Fe and Ni were alternately deposited on a Cu buffer layer, all of which grew epitaxially on the Si substrates. A good crystal structure and epitaxial relationship was confirmed by in-house x-ray diffraction (XRD). The chemical order, which to some part is the origin of an uniaxial magnetic anisotropy, was measured by resonant XRD. The 001 superlattice reflection was split in two symmetrically spaced peaks due to a composition modulation of the Fe and Ni layers. Furthermore the influence of roughness induced chemical anti-phase domains on the RXRD pattern is exemplified. A smaller than expected magnetic uniaxial anisotropy energy was obtained, which is partly due to the composition modulations, but the major reason is concluded to be the Cu buffer surface roughness.

Subject headings

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Keyword

resonant x-ray diffraction

FeNi

L10

magnetron sputtering

chemical order

magnetic anisotropy

magnetic properties of thin film

Publication and Content Type

ref (subject category)

art (subject category)