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Deep surface Cu depletion induced by K in high-efficiency Cu(In,Ga)Se2 solar cell absorbers

Donzel-Gargand, Olivier (author)
Uppsala universitet,Fasta tillståndets elektronik
Thersleff, Thomas, 1980- (author)
Stockholms Univ, Nat Skapliga Fak, Inst Mat & Miljokemi, Stockholm
Keller, Jan (author)
Uppsala universitet,Fasta tillståndets elektronik
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Törndahl, Tobias, 1974- (author)
Uppsala universitet,Fasta tillståndets elektronik
Larsson, Fredrik (author)
Uppsala universitet,Fasta tillståndets elektronik
Wallin, Erik (author)
Solibro Research AB, Uppsala, Sweden
Stolt, Lars (author)
Uppsala universitet,Fasta tillståndets elektronik,Solibro Research AB, Uppsala, Sweden
Edoff, Marika, 1965- (author)
Uppsala universitet,Fasta tillståndets elektronik
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 (creator_code:org_t)
2018-03-25
2018
English.
In: Progress in Photovoltaics. - : Wiley. - 1062-7995 .- 1099-159X. ; 26:9, s. 730-739
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • In this work, we used K‐rich glass substrates to provide potassium during the coevaporation of Cu(In,Ga)Se2 (CIGS) absorber layers. Subsequently, we applied a postdeposition treatment (PDT) using KF or RbF to some of the grown absorbers. It was found that the presence of K during the growth of the CIGS layer led to cell effi- ciencies beyond 17%, and the addition of a PDT pushed it beyond 18%. The major finding of this work is the observation of discontinuous 100‐ to 200‐nm‐deep Cu‐ depleted patches in the vicinity of the CdS buffer layer, correlated with the presence of K during the growth of the absorber layer. The PDT had no influence on the forma- tion of these patches. A second finding concerns the composition of the Cu‐depleted areas, where an anticorrelation between Cu and both In and K was measured using scanning transmission electron microscopy. Furthermore, a steeper Ga/(In+Ga) ratio gradient was measured for the absorbers grown with the presence of K, suggesting that K hinders the group III element interdiffusion. Finally, no Cd in‐diffusion to the CIGS layer could be detected. This indicates that if CdCu substitution occurs, either their concentration is below our instrumental detection limit or its presence is contained within the first 6 nm from the CdS/CIGS interface.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Materialteknik -- Annan materialteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Materials Engineering -- Other Materials Engineering (hsv//eng)
TEKNIK OCH TEKNOLOGIER  -- Naturresursteknik -- Energisystem (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Environmental Engineering -- Energy Systems (hsv//eng)

Keyword

CIGS
Cu depletion
EELS
OVC
Raman
solar cell
TEM

Publication and Content Type

ref (subject category)
art (subject category)

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