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Theoretical investigation of the thickness dependence of soft-x-ray emission from thin AlAs(100) layers buried in GaAs
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- Mankefors, S (author)
- Uppsala universitet,Fysiska institutionen
- Nilsson, PO (author)
- Kanski, J (author)
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- Andersson, T (author)
- Karlsson, K (author)
- Agui, A (author)
- Sathe, C (author)
- Guo, JH (author)
- Nordgren, J (author)
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- (creator_code:org_t)
- AMERICAN PHYSICAL SOC, 2000
- 2000
- English.
- In: PHYSICAL REVIEW B. - : AMERICAN PHYSICAL SOC. - 1098-0121. ; 61:8, s. 5540-5545
- Journal article (peer-reviewed)
Abstract
Subject headings
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- Ultrathin AlAs(100) layers of 1-, 2-, and 5-ML thickness buried in GaAs are investigated by nb initio calculations. Unique experimental soft-x-ray emission spectra are explained in terms of interface effects and changes with layer thickness are found in t
Keyword
- NORM-CONSERVING PSEUDOPOTENTIALS; BAND OFFSETS; GAAS/ALAS SUPERLATTICES; ELECTRONIC-STRUCTURE; GROUND-STATE; MODEL; HETEROJUNCTIONS; SURFACES; DENSITY
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- ref (subject category)
- art (subject category)
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- Mankefors, S
- Nilsson, PO
- Kanski, J
- Andersson, T
- Karlsson, K
- Agui, A
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- Sathe, C
- Guo, JH
- Nordgren, J
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