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Electrical resistivity and band-gap shift of Si-doped GaN and metal-nonmetal transition in cubic GaN, InN and AlN systems

Fernandez, JRL (author)
Uppsala universitet,Fysiska institutionen
Araujo, CM (author)
da, Silva AF (author)
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Leite, JR (author)
Sernelius, BE (author)
Tabata, A (author)
Abramof, E (author)
Chitta, VA (author)
Persson, C (author)
Ahuja, R (author)
Pepe, I (author)
As, DJ (author)
Frey, T (author)
Schikora, D (author)
Lischka, K (author)
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 (creator_code:org_t)
ELSEVIER SCIENCE BV, 2001
2001
English.
In: JOURNAL OF CRYSTAL GROWTH. - : ELSEVIER SCIENCE BV. - 0022-0248. ; 231:3, s. 420-427
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • The critical impurity concentration N-c of the metal-nonmetal (MNM) transition for the cubic GaN, InN and AIN systems. is calculated using the following two different criteria: vanishing of the donor binding energy and the crossing point between the energ

Keyword

characterization; doping; molecular beam epitaxy; nitrides; SEMICONDUCTORS; SI-P;BI; DEVICES; DONOR; GAAS

Publication and Content Type

ref (subject category)
art (subject category)

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