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Non-destructive chemical analysis of sandwich structures by means of soft X-ray emission
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- Galnander, B (author)
- Uppsala universitet
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- Kaambre, T (author)
- Uppsala universitet
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- Blomquist, P (author)
- Uppsala universitet
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- (creator_code:org_t)
- ELSEVIER SCIENCE SA, 1999
- 1999
- English.
- In: THIN SOLID FILMS. - : ELSEVIER SCIENCE SA. - 0040-6090. ; 344, s. 35-38
- Journal article (other academic/artistic)
Abstract
Subject headings
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- Soft X-ray emission spectroscopy provides information about elemental composition, including the light elements, as well as the chemical bonding. The probe depth reaches hundreds of nanometers but under certain conditions considerable surface sensitivity
Keyword
- X-ray emission; depth profiling; multilayers; sputtering; FLUORESCENCE SPECTROSCOPY; TRANSMISSION; ABSORPTION; SCATTERING; REFLECTION; OXIDATION
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- vet (subject category)
- art (subject category)
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- Galnander, B
- Kaambre, T
- Blomquist, P
- Nilsson, E
- Guo, J
- Rubensson, JE
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- Nordgren, J
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- THIN SOLID FILMS
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- Uppsala University
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