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IN-SITU MONITORING OF HFCVD DIAMOND GROWTH ON NICKEL USING SOFT-X-RAY EMISSION-SPECTROSCOPY
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- SKYTT, P (author)
- Uppsala universitet
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- JOHANSSON, E (author)
- Uppsala universitet
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- CARLSSON, JO (author)
- Uppsala universitet
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- PERGAMON-ELSEVIER SCIENCE LTD, 1995
- 1995
- English.
- In: VACUUM. - : PERGAMON-ELSEVIER SCIENCE LTD. - 0042-207X. ; 46:8-10, s. 1053-1054
- Journal article (other academic/artistic)
Abstract
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- It is well known that by analysing the C-K-emission from low pressure grown diamond films that it is possible to extract information of the types of bonding present. A HFCVD reactor has been constructed which together with a small soft X-ray emission spec
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- SKYTT, P
- JOHANSSON, E
- CARLSSON, JO
- WASSDAHL, N
- NORDGREN, J
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- VACUUM
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- Uppsala University
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