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Single particle raster image analysis of diffusion

Longfils, Marco, 1990 (author)
Gothenburg University,Göteborgs universitet,Institutionen för matematiska vetenskaper,Department of Mathematical Sciences,Chalmers tekniska högskola,Chalmers University of Technology,University of Gothenburg,Chalmers University of Technology, Sweden; University of Gothenburg, Sweden
Schuster, E. (author)
RISE,Jordbruk och livsmedel
Lorén, Niklas, 1970 (author)
RISE,Jordbruk och livsmedel
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Särkkä, Aila, 1962 (author)
Gothenburg University,Göteborgs universitet,Institutionen för matematiska vetenskaper,Department of Mathematical Sciences,University of Gothenburg,Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Sweden; University of Gothenburg, Sweden
Rudemo, Mats, 1937 (author)
Gothenburg University,Göteborgs universitet,Institutionen för matematiska vetenskaper,Department of Mathematical Sciences,University of Gothenburg,Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Sweden; University of Gothenburg, Sweden
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 (creator_code:org_t)
2016-12-05
2017
English.
In: Journal of Microscopy. - : Wiley. - 0022-2720 .- 1365-2818. ; 266:1, s. 3-14
  • Journal article (peer-reviewed)
Abstract Subject headings
Close  
  • As a complement to the standard RICS method of analysing Raster Image Correlation Spectroscopy images with estimation of the image correlation function, we introduce the method SPRIA, Single Particle Raster Image Analysis. Here, we start by identifying individual particles and estimate the diffusion coefficient for each particle by a maximum likelihood method. Averaging over the particles gives a diffusion coefficient estimate for the whole image. In examples both with simulated and experimental data, we show that the new method gives accurate estimates. It also gives directly standard error estimates. The method should be possible to extend to study heterogeneous materials and systems of particles with varying diffusion coefficient, as demonstrated in a simple simulation example. A requirement for applying the SPRIA method is that the particle concentration is low enough so that we can identify the individual particles. We also describe a bootstrap method for estimating the standard error of standard RICS.

Subject headings

NATURVETENSKAP  -- Matematik -- Sannolikhetsteori och statistik (hsv//swe)
NATURAL SCIENCES  -- Mathematics -- Probability Theory and Statistics (hsv//eng)
NATURVETENSKAP  -- Fysik -- Annan fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences -- Other Physics Topics (hsv//eng)
TEKNIK OCH TEKNOLOGIER  -- Medicinteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Medical Engineering (hsv//eng)

Keyword

Bias correction
Bootstrap
Confocal laser scanning microscopy
Diffusion
Fluorescent beads
Maximum likelihood
Confocal laser scanning microscopy

Publication and Content Type

ref (subject category)
art (subject category)

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