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- Wallentin, JesperUniversity of Göttingen (author)
Hard X-ray Detection Using a Single nm Diameter Nanowire
- Article/chapterEnglish2014
Publisher, publication year, extent ...
- 2014-12-01
- American Chemical Society (ACS),2014
Numbers
- LIBRIS-ID:oai:lup.lub.lu.se:130a9b5b-8e54-414b-b9a5-f76859ead926
- https://lup.lub.lu.se/record/4944730URI
- https://doi.org/10.1021/nl5040545DOI
Supplementary language notes
- Language:English
- Summary in:English
Part of subdatabase
- SwePubSwePub
Classification
Notes
- Submicron sized sensors could allow higher resolution in X-ray imaging and diffraction measurements, which are ubiquitous for materials science and medicine. We present electrical measurements of a single 100 nm diameter InP nanowire transistor exposed to hard X-rays. The X-ray induced conductance is over 5 orders of magnitude larger than expected from reported data for X-ray absorption and carrier lifetimes. Time-resolved measurements show very long characteristic lifetimes on the order of seconds, tentatively attributed to long-lived traps, which give a strong amplification effect. As a proof of concept, we use the nanowire to directly image an X-ray nanofocus with submicron resolution.
Subject headings and genre
- TEKNIK OCH TEKNOLOGIER Nanoteknik Nanoteknik hsv//swe
- ENGINEERING AND TECHNOLOGY Nano-technology Nano-technology hsv//eng
- Nanowires
- X-rays
- detector
- III-V
Added entries (persons, corporate bodies, meetings, titles ...)
- Osterhoff, MarkusUniversity of Göttingen (author)
- Wilke, Robin N.University of Göttingen (author)
- Persson, Karl-MagnusLund University,Lunds universitet,Institutionen för elektro- och informationsteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Electrical and Information Technology,Departments at LTH,Faculty of Engineering, LTH(Swepub:lu)eit-krp (author)
- Wernersson, Lars-ErikLund University,Lunds universitet,Institutionen för elektro- och informationsteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Electrical and Information Technology,Departments at LTH,Faculty of Engineering, LTH(Swepub:lu)ftf-lwe (author)
- Sprung, MichaelGerman Electron Synchrotron (DESY) (author)
- Salditt, TimUniversity of Göttingen (author)
- University of GöttingenInstitutionen för elektro- och informationsteknik (creator_code:org_t)
Related titles
- In:Nano Letters: American Chemical Society (ACS)14:12, s. 7071-70761530-69921530-6984
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