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Picosecond time-resolved x-ray refectivity of a laser-heated amorphous carbon film
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- Nüske, Ralf (author)
- Lund University,Lunds universitet,Atomfysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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- Jurgilaitis, Andrius (author)
- Lund University,Lunds universitet,Atomfysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
- Enquist, H. (author)
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- Farahani, S. Dastjani (author)
- Gaudin, J. (author)
- Guerin, L. (author)
- von Korff, C. (author)
- Stoermer, M. (author)
- Wulff, M. (author)
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- (creator_code:org_t)
- 2011-03-10
- 2011
- English.
- In: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 98:10
- Journal article (peer-reviewed)
Abstract
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- We demonstrate thin film x-ray reflectivity measurements with picosecond time resolution. Amorphous carbon films with a thickness of 46 nm were excited with laser pulses characterized by 100 fs duration, a wavelength of 800 nm, and a fluence of 70 mJ/cm(2). The laser-induced stress caused a rapid expansion of the thin film followed by a relaxation of the film thickness as heat diffused into the silicon substrate. We were able to measure changes in film thickness as small as 0.2 nm. The relaxation dynamics are consistent with a model which accounts for carrier-enhanced substrate heat diffusivity. (C) 2011 American Institute of Physics. [doi:10.1063/1.3562967]
Subject headings
- NATURVETENSKAP -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)
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- Harb, Maher
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