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In-situ manipulations and electrical measurements of III-V nanowhiskers with TEM-STM
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- Larsson, Magnus (author)
- Lund University,Lunds universitet,Centrum för analys och syntes,Kemiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Centre for Analysis and Synthesis,Department of Chemistry,Departments at LTH,Faculty of Engineering, LTH
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- Wallenberg, Reine (author)
- Lund University,Lunds universitet,Centrum för analys och syntes,Kemiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Centre for Analysis and Synthesis,Department of Chemistry,Departments at LTH,Faculty of Engineering, LTH
- Persson, A.I. (author)
- show more...
- Ohlsson, B.J. (author)
- Samuelson, L. (author)
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- (creator_code:org_t)
- 2002
- 2002
- English 2 s.
- In: 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science.
- Conference paper (peer-reviewed)
Abstract
Subject headings
Close
- A scanning tunnelling microscope (STM) mounted in a sample holder for a transmission electron microscope (TEM), a TEM-STM, have been used for in-situ electrical measurements of semiconductor nano whiskers. The device enables measurements and manipulations of nano structures while observing them in a TEM
Subject headings
- NATURVETENSKAP -- Kemi (hsv//swe)
- NATURAL SCIENCES -- Chemical Sciences (hsv//eng)
Keyword
- transmission electron microscopy
- STM
- scanning tunnelling microscopy
- III-V nanowhiskers
- in situ manipulations
- electrical measurements
- TEM
- semiconductor nanowhiskers
- nano structures
- InAs/InP nanowhisker
- InAs-InP
Publication and Content Type
- kon (subject category)
- ref (subject category)
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- Samuelson, L.
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- NATURAL SCIENCES
- NATURAL SCIENCES
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- Lund University
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