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Repetitive ultrafas...
Repetitive ultrafast melting of InSb as an x-ray timing diagnostic
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- Allaf Navirian, Hengameh (author)
- Lund University,Lunds universitet,Atomfysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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- Enquist, Henrik (author)
- Lund University,Lunds universitet,MAX IV-laboratoriet,Atomfysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,MAX IV Laboratory,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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- Hansen, Tue (author)
- Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory
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- Mikkelsen, Anders (author)
- Lund University,Lunds universitet,Synkrotronljusfysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Synchrotron Radiation Research,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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- Sondhauss, Peter (author)
- Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory
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- Srivastava, Alok (author)
- Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory
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- Zakharov, Alexei (author)
- Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory
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- Larsson, Jörgen (author)
- Lund University,Lunds universitet,MAX IV-laboratoriet,Atomfysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,MAX IV Laboratory,Atomic Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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(creator_code:org_t)
- AIP Publishing, 2008
- 2008
- English.
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In: Applied Physics Reviews. - : AIP Publishing. - 1931-9401. ; 103:10, s. 6-103510
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http://dx.doi.org/10...
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Abstract
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- We have demonstrated the possibility of using repetitive ultrafast melting of InSb as a timing diagnostic in connection with visible-light pump/x-ray probe measurements at high-repetition-rate x-ray facilities. Although the sample was molten and regrown approximately 1x10(6) times, a distinct reduction in time-resolved x-ray reflectivity could be observed using a streak camera with a time resolution of 2.5 ps. The time-resolved x-ray reflectivity displayed this distinct decrease despite the fact that the average reflectivity of the sample had fallen to approximately 50% of its original value due to accumulated damage from the prolonged laser exposure. The topography of the laser-exposed sample was mapped using an optical microscope, a stylus profilometer, photoelectron microscopy, and a scanning tunneling microscope. Although the surface of the sample is not flat following prolonged exposure at laser fluences above 15 mJ/cm(2), the atomic scale structure regrows, and thus, regenerates the sample on a nanosecond timescale. In the fluence range between 15 and 25 mJ/cm(2), the laser power is sufficient to melt the sample, while regrowth occurs with a sufficiently good structure to allow the extraction of timing information via ultrafast time-resolved x-ray measurements. This can be applied for timing purposes at synchrotron radiation and x-ray free-electron laser facilities. It is also noteworthy that we were able to reproduce the fluence dependencies of melting depth and disordering time previously obtained in single-shot, nonthermal melting experiments with higher temporal resolution.
Subject headings
- NATURVETENSKAP -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)
Publication and Content Type
- art (subject category)
- ref (subject category)
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