Soft-x-ray polarimeter with multilayer optics : Complete analysis of the polarization state of light

Nyholm, Ralf (author): Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory

Eriksson, Mikael (author): Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory

(creator_code:org_t)

Abstract Subject headings

The design of a versatile high-precision eight-axis ultrahigh-vacuum-compatible polarimeter is presented. This multipurpose instrument can be used as a self-calibrating polarization detector for linearly and circularly polarized UV and soft-x-ray light. It can also be used for the characterization of reflection or transmission properties (reflectometer) or polarizing and phase-retarding properties (ellipsometer) of any optical element. The polarization properties of Mo/Si, Cr/C, Cr/Sc, and Ni/Ti multilayers used in this polarimeter as polarizers in transmission and as analyzers in reflection have been investigated theoretically and experimentally. In the soft-x-ray range, close to the 2p edges of Sc, Ti, and Cr, resonantly enhanced phase retardation of the transmission polarizers of as much as 18° has been measured. With these newly developed optical elements the complete polarization analysis of soft-x-ray synchrotron radiation can be extended to the water-window range from 300 to 600 eV.

By the author/editor: Schäfers, Franz; Mertins, Hans Ch ...; Gaupp, Andreas; Gudat, Wolfgang; Mertin, Marcel; Packe, Ingo; show more...; Schmolla, Frank; Di Fonzo, Silvia; Soullié, Gérard; Jark, Werner; Walker, Richard; Le Cann, Xavier; Nyholm, Ralf; Eriksson, Mikael; show less...

About the subject

NATURAL SCIENCES: NATURAL SCIENCES; and Physical Science ...; and Accelerator Phys ...

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