Particle-Induced X-Ray Emission: A Useful Analytical Method

• Abstract in UndeterminedIn 1970, it was shown experimentally by Johansson et al. that the excitation of atoms by charged particles, e.g. protons, and the subsequent detection of the induced X-rays by an energy-dispersive detector constitutes a non-destructive multi-elemental method with low detection limits and several other properties desirable in an analytical method. Since then, many investigations have been performed and the method, known as particle-induced X-ray emission (PIXE), has been developed further. The development of suitable methods of pretreating samples for PIXE analysis has also been intensively pursued. In the Proceedings of the International Conference of Particle-induced X-ray Emission, the method and its applications are thoroughly reviewed. Two reviews have also recently been published.In this summary, the principles and properties of PIXE are discussed. Possible areas of application are briefly discussed, and limits of detection of elements in blood plasma are considered.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Maskinteknik -- Produktionsteknik, arbetsvetenskap och ergonomi (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Mechanical Engineering -- Production Engineering, Human Work Science and Ergonomics (hsv//eng)

NATURVETENSKAP  -- Fysik -- Subatomär fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Subatomic Physics (hsv//eng)

Keyword

multielemental analysis

PIXE

particle-induced x-ray emission

Publication and Content Type

kon (subject category)

ref (subject category)