Detection of sub-pixel fractures in X-ray dark-field tomography

• We present a new method for detecting fractures in solid materials below the resolution given by the detector pixel size by using grating-based X-ray interferometry. The technique is particularly useful for detecting sub-pixel cracks in large samples where the size of the sample is preventing high-resolution mu CT studies of the entire sample. The X-ray grating interferometer produces three distinct modality signals: absorption, phase and dark field. The method utilizes the unique scattering features of the dark-field signal. We have used tomograms reconstructed from each of the three signals to detect cracks in a model sample consisting of stearin.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Materialteknik -- Annan materialteknik (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Materials Engineering -- Other Materials Engineering (hsv//eng)

Publication and Content Type

art (subject category)

ref (subject category)