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Control-Quality Dri...
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Aminifar, AmirSwiss Federal Institute of Technology,Embedded Systems Laboratory, École Polytechnique Fédérale de Lausanne (EPFL), Switzerland.
(author)
Control-Quality Driven Design of Embedded Control Systems with Stability Guarantees
- Article/chapterEnglish2018
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LIBRIS-ID:oai:lup.lub.lu.se:aa74c893-f244-4207-87bd-fd5ac088a49e
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https://lup.lub.lu.se/record/aa74c893-f244-4207-87bd-fd5ac088a49eURI
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https://doi.org/10.1109/MDAT.2017.2766564DOI
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https://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-142784URI
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Language:English
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Summary in:English
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Today, the majority of control applications in embedded systems, e.g., in the automotive domain, are implemented as software tasks on shared platforms. Ignoring implementation impacts during the design of embedded control systems results in complex timing behaviors that may lead to poor performance and, in the worst case, instability of control applications. This article presents a methodology for implementation-aware design of high-quality and stable embedded control systems on shared platforms with complex timing behaviors.
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Eles, Petru,1954-Linköpings universitet,Linköping University,Programvara och system,Tekniska fakulteten(Swepub:liu)petel71
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Peng, Zebo,1958-Linköpings universitet,Linköping University,Programvara och system,Tekniska fakulteten(Swepub:liu)zebpe83
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Cervin, AntonLund University,Lunds universitet,Institutionen för reglerteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Automatic Control,Departments at LTH,Faculty of Engineering, LTH,Department of Automatic Control, Lund University, Sweden(Swepub:lu)cont-ace
(author)
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Årzén, Karl-ErikLund University,Lunds universitet,Institutionen för reglerteknik,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Automatic Control,Departments at LTH,Faculty of Engineering, LTH,Department of Automatic Control, Lund University, Sweden(Swepub:lu)cont-kar
(author)
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Swiss Federal Institute of TechnologyEmbedded Systems Laboratory, École Polytechnique Fédérale de Lausanne (EPFL), Switzerland.
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In:IEEE Design and Test: IEEE35:4, s. 38-462168-23562168-2364
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