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Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters
- Lundwall, M (author)
-
- Tchaplyguine, Maxim (author)
- Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory
- Ohrwall, G (author)
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- Lindblad, A (author)
- Rander, T (author)
- Svensson, S (author)
- Bjorneholm, O (author)
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- (creator_code:org_t)
- Elsevier BV, 2005
- 2005
- English.
- In: Surface Science. - : Elsevier BV. - 0039-6028. ; 594:1-3, s. 12-19
- Journal article (peer-reviewed)
Abstract
Subject headings
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- The surface-to-bulk intensity ratio in Auger electron spectra has been studied in comparison with core-level photoelectron spectra using free argon clusters of sizes ranging over two orders of magnitude. Enhanced surface sensitivity is observed in L2,3M2,3M2.3 Auger electron spectra compared to 2p photoelectron spectra where electrons of similar kinetic energies were recorded. This is discussed in terms of the effective attenuation length of the electrons.
Subject headings
- NATURVETENSKAP -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)
- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
Keyword
- photoelectron
- Auger ejection
- photoelectron spectroscopy
- spectroscopy
- Auger electron
- surface sensitivity
- effective attenuation length-
- synchrotron radiation photoelectron spectroscopy
- emission
Publication and Content Type
- art (subject category)
- ref (subject category)
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- Bjorneholm, O
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