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Characterization of...
Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction
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- Davtyan, Arman (author)
- University of Siegen
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- Lehmann, Sebastian (author)
- Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Fasta tillståndets fysik,Fysiska institutionen,Institutioner vid LTH,Other operations, LTH,Faculty of Engineering, LTH,Solid State Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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- Kriegner, Dominik (author)
- Charles University in Prague
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- Zamani, Reza R. (author)
- Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Fasta tillståndets fysik,Fysiska institutionen,Institutioner vid LTH,Other operations, LTH,Faculty of Engineering, LTH,Solid State Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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- Dick, Kimberly A. (author)
- Lund University,Lunds universitet,NanoLund: Centre for Nanoscience,Annan verksamhet, LTH,Lunds Tekniska Högskola,Fasta tillståndets fysik,Fysiska institutionen,Institutioner vid LTH,Centrum för analys och syntes,Kemiska institutionen,Other operations, LTH,Faculty of Engineering, LTH,Solid State Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH,Centre for Analysis and Synthesis,Department of Chemistry,Faculty of Engineering, LTH
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- Bahrami, Danial (author)
- University of Siegen
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- Al-Hassan, Ali (author)
- University of Siegen
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- Leake, Steven J. (author)
- European Synchrotron Radiation Facility
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- Pietsch, Ullrich (author)
- University of Siegen
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- Holý, Václav (author)
- Charles University in Prague
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(creator_code:org_t)
- 2017
- 2017
- English 10 s.
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In: Journal of Synchrotron Radiation. - 0909-0495. ; 24:5, s. 981-990
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Abstract
Subject headings
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- Coherent X-ray diffraction was used to measure the type, quantity and the relative distances between stacking faults along the growth direction of two individual wurtzite GaAs nanowires grown by metalorganic vapour epitaxy. The presented approach is based on the general property of the Patterson function, which is the autocorrelation of the electron density as well as the Fourier transformation of the diffracted intensity distribution of an object. Partial Patterson functions were extracted from the diffracted intensity measured along the direction in the vicinity of the wurtzite Bragg peak. The maxima of the Patterson function encode both the distances between the fault planes and the type of the fault planes with the sensitivity of a single atomic bilayer. The positions of the fault planes are deduced from the positions and shapes of the maxima of the Patterson function and they are in excellent agreement with the positions found with transmission electron microscopy of the same nanowire.The application of the synchrotron-radiation-based coherent nanobeam X-ray diffraction method to study the type, quantity and the exact distances in between stacking faults in single GaAs nanowires is demonstrated.
Subject headings
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
Keyword
- coherent nanobeam X-ray diffraction
- nanowire
- Patterson function
- stacking faults
Publication and Content Type
- art (subject category)
- ref (subject category)
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- By the author/editor
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Davtyan, Arman
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Lehmann, Sebasti ...
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Kriegner, Domini ...
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Zamani, Reza R.
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Dick, Kimberly A ...
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Bahrami, Danial
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show more...
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Al-Hassan, Ali
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Leake, Steven J.
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Pietsch, Ullrich
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Holý, Václav
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show less...
- About the subject
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- NATURAL SCIENCES
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NATURAL SCIENCES
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and Physical Science ...
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and Condensed Matter ...
- Articles in the publication
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Journal of Synch ...
- By the university
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Lund University