Resonant inelastic X-ray scattering at the K edge of oxygen and fluorine in insulators

• Here we present the results of a study of the electronic structure using the resonant inelastic scattering process at the F 1s photoabsorption edge in LiF and O 1s edge of MgO crystals. In case of excitations in the sub-threshold region, the Raman-type linear dispersion of X-ray fluorescence peak was observed for the studied compounds. In LiF, the narrowing of the X-ray fluorescence peak is observed at pre-threshold excitation, which can be related to the creation of a core exciton, but no core excitons were identified in MgO.

Subject headings

NATURVETENSKAP  -- Fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

Keyword

resonant inelastic X-ray scattering

X-ray emission

core exciton

Publication and Content Type

art (subject category)

ref (subject category)