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Resonant inelastic ...
Resonant inelastic X-ray scattering at the K edge of oxygen and fluorine in insulators
- Article/chapterEnglish2005
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LIBRIS-ID:oai:lup.lub.lu.se:d6abbec9-3e2e-4b7b-8818-5ad8d081cc26
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https://lup.lub.lu.se/record/237430URI
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https://doi.org/10.1016/j.elspec.2005.01.205DOI
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Language:English
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Summary in:English
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Subject category:art swepub-publicationtype
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Notes
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Here we present the results of a study of the electronic structure using the resonant inelastic scattering process at the F 1s photoabsorption edge in LiF and O 1s edge of MgO crystals. In case of excitations in the sub-threshold region, the Raman-type linear dispersion of X-ray fluorescence peak was observed for the studied compounds. In LiF, the narrowing of the X-ray fluorescence peak is observed at pre-threshold excitation, which can be related to the creation of a core exciton, but no core excitons were identified in MgO.
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Käämbre, TanelLund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory(Swepub:lu)maxl-tka
(author)
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Kisand, V
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Saar, A
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Kooser, K
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Nommiste, E
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Martinson, IndrekLund University,Lunds universitet,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Physics,Departments at LTH,Faculty of Engineering, LTH(Swepub:lu)fysi-ima
(author)
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Lunds universitetMAX IV-laboratoriet
(creator_code:org_t)
Related titles
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In:Journal of Electron Spectroscopy and Related Phenomena: Elsevier BV144-147, s. 845-8480368-2048
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