Resonant inelastic X-ray scattering at the K edge of oxygen and fluorine in insulators

Here we present the results of a study of the electronic structure using the resonant inelastic scattering process at the F 1s photoabsorption edge in LiF and O 1s edge of MgO crystals. In case of excitations in the sub-threshold region, the Raman-type linear dispersion of X-ray fluorescence peak was observed for the studied compounds. In LiF, the narrowing of the X-ray fluorescence peak is observed at pre-threshold excitation, which can be related to the creation of a core exciton, but no core excitons were identified in MgO.

Käämbre, TanelLund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory(Swepub:lu)maxl-tka (author)
Kisand, V (author)
Saar, A (author)
Kooser, K (author)
Nommiste, E (author)
Martinson, IndrekLund University,Lunds universitet,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Department of Physics,Departments at LTH,Faculty of Engineering, LTH(Swepub:lu)fysi-ima (author)
Lunds universitetMAX IV-laboratoriet (creator_code:org_t)

In:Journal of Electron Spectroscopy and Related Phenomena: Elsevier BV144-147, s. 845-8480368-2048

By the author/editor: Kikas, A; Käämbre, Tanel; Kisand, V; Saar, A; Kooser, K; Nommiste, E; show more...; Martinson, Indre ...; show less...

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