Proton-Induced X-ray Emission Spectroscopy in Elemental Trace Analysis

• Using protons in the MeV range as excitation source and a high resolution Si(Li) detector,X-ray emission spectroscopy is shown to be capable of analyzing many elements with Z > 15 simultaneously at the 10-12 g level. This work discusses a theoretical lower limit of detection at moderate proton energies and gives examples of possible applications: analysis of the elemental composition of air-borne particles as a function of particle size, oil slick identification, and analysis of water and blood serum.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Maskinteknik -- Produktionsteknik, arbetsvetenskap och ergonomi (hsv//swe)

ENGINEERING AND TECHNOLOGY  -- Mechanical Engineering -- Production Engineering, Human Work Science and Ergonomics (hsv//eng)

NATURVETENSKAP  -- Fysik -- Subatomär fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Subatomic Physics (hsv//eng)

Keyword

PIXE

particle induced x-ray emission analysis

trace element analysis

Publication and Content Type

art (subject category)

ref (subject category)