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New Flexible Toolbox for Nanomechanical Measurements with Extreme Precision and at Very High Frequencies.
- Fian, Alexander (author)
-
- Lexholm, Monica (author)
- Lund University,Lunds universitet,Fasta tillståndets fysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Solid State Physics,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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- Timm, Rainer (author)
- Lund University,Lunds universitet,Synkrotronljusfysik,Fysiska institutionen,Institutioner vid LTH,Lunds Tekniska Högskola,Synchrotron Radiation Research,Department of Physics,Departments at LTH,Faculty of Engineering, LTH
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- (creator_code:org_t)
- 2010-08-26
- 2010
- English.
- In: Nano Letters. - : American Chemical Society (ACS). - 1530-6992 .- 1530-6984. ; 10:Online August 26, 2010, s. 3893-3898
- Journal article (peer-reviewed)
Abstract
Subject headings
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- We show that the principally two-dimensional (2D) scanning tunneling microscope (STM) can be used for imaging of 1D micrometer high free-standing nanowires. We can then determine nanowire megahertz resonance frequencies, image their top-view 2D resonance shapes, and investigate axial stress on the nanoscale. Importantly, we demonstrate the extreme sensitivity of electron tunneling even at very high frequencies by measuring resonances at hundreds of megahertz with a precision far below the angstrom scale.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Nanoteknik -- Nanoteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Nano-technology -- Nano-technology (hsv//eng)
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- Fian, Alexander
- Lexholm, Monica
- Timm, Rainer
- Mandl, Bernhard
- Håkanson, Ulf
- Hessman, Dan
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- Lundgren, Edvin
- Samuelson, Lars
- Mikkelsen, Ander ...
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- ENGINEERING AND TECHNOLOGY
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- Lund University
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