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Charging phenomena ...
Charging phenomena at the interface between high-k dielectrics and SiOx interlayers
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- Engström, Olof, 1943 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Raeissi, Bahman, 1979 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Piscator, Johan, 1977 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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Mitrovic, I. Z. (author)
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Hall, S. (author)
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Gottlob, H. D. B. (author)
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Schmidt, M. (author)
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Hurley, P.K. (author)
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Cherkaoui, K. (author)
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(creator_code:org_t)
- 2009
- 2009
- English.
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In: 8th Symposium Diagnostics & Yield Advanced Silicon Devices and Technologies for the ULSI Era, Warsaw, June 22 - 24, 2009 (Invited).
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https://research.cha...
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Annan teknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Other Engineering and Technologies (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Annan teknik -- Övrig annan teknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Other Engineering and Technologies -- Other Engineering and Technologies not elsewhere specified (hsv//eng)
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- ref (subject category)
To the university's database
- By the author/editor
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Engström, Olof, ...
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Raeissi, Bahman, ...
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Piscator, Johan, ...
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Mitrovic, I. Z.
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Hall, S.
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Gottlob, H. D. B ...
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show more...
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Schmidt, M.
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Hurley, P.K.
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Cherkaoui, K.
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show less...
- About the subject
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Other Engineerin ...
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Other Engineerin ...
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and Other Engineerin ...
- Articles in the publication
- 8th Symposium Di ...
- By the university
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Chalmers University of Technology