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Environmental relia...
Environmental reliability of nano-structured polymer-metal composite thermal interface material
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- Lu, Xiuzhen (author)
- Shanghai University
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- Zhuang, Mengke (author)
- Shanghai University
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- Zhang, Lei (author)
- Shanghai University
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- Ye, Lilei, 1970 (author)
- Shanghai University,SHT Smart High-Tech AB
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- Liu, Johan, 1960 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- ISBN 9781467316804
- 2012
- 2012
- English.
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In: Proceedings of IEEE CPMT 2012 International Conference on Electronic Packaging Technology & High Density Packaging. - 9781467316804 ; , s. 1326-1328
- Related links:
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http://dx.doi.org/10...
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https://doi.org/10.1...
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https://research.cha...
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Abstract
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- Heat dissipation has become a `bottleneck' for the properties of electronics products and photoelectronic devices. Thermal interface material (TIM) plays a key role in heat dissipation, and must have flexibility and high thermal conductivity in order to decrease the thermal resistance of the interface between the device and heat sink or cooler. We developed a new type of nano-TIM based electrospun technology. Metal with low melting point was injected into the polymer nanofiber scaffold fabricated by electrospun. The heat of the electronic devices dispersed through the metal, resulting in high thermal conductivity of the nano-TIM. Environmental reliability of nano-structured polymer-metal composite thermal interface material was studied by thermal cycling test. A sandwich structure was used to get shear strength of pull test. The shear strength of the samples dropped to about 50% after 500 cycles. SEM and EDS results indicate that overflow of alloy during thermal cycling test leads to decreasing shear strength.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
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- kon (subject category)
- ref (subject category)
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