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Efficient correctio...
Efficient correction for both direction-dependent and baseline-dependent effects in interferometric imaging: An A-stacking framework
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- Young, A. (author)
- Universiteit Stellenbosch,Stellenbosch University
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- Wijnholds, S. J. (author)
- Netherlands Institute for Radio Astronomy (ASTRON)
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- Carozzi, Tobia, 1966 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Maaskant, Rob, 1978 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Ivashina, Marianna, 1975 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Davidson, D. B. (author)
- Universiteit Stellenbosch,Stellenbosch University
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(creator_code:org_t)
- 2015-05-01
- 2015
- English.
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In: Astronomy and Astrophysics. - : EDP Sciences. - 0004-6361 .- 1432-0746. ; 577, s. Art. no. A56-
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Abstract
Subject headings
Close
- A general framework is presented for modeling direction-dependent effects that are also baseline-dependent, as part of the calibration and imaging process. Within this framework such effects are represented as a parametric linear model in which basis functions account for direction dependence, whereas expansion coefficients account for the baseline dependence. This separation enables the use of a multiple fast Fourier transform-based implementation of the forward calculation (sky to visibility) in a manner similar to the W-stacking solution for non-coplanar baselines, and offers a potential improvement in computational efficiency in scenarios where the gridding operation in a convolution-based approach to direction-dependent effects may be too costly. Two novel imaging approaches that are possible within this framework are also presented.
Subject headings
- NATURVETENSKAP -- Fysik -- Fusion, plasma och rymdfysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Fusion, Plasma and Space Physics (hsv//eng)
Keyword
- methods: analytical
- techniques: image processing
- methods: numerical
Publication and Content Type
- art (subject category)
- ref (subject category)
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