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Direct observation ...
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Adolfsson, Göran,1981Chalmers tekniska högskola,Chalmers University of Technology
(author)
Direct observation of lateral carrier diffusion in ridge waveguide 1.3 um GaInNAs-GaAs lasers using scanning near-field optical microscopy
- Article/chapterEnglish2008
Publisher, publication year, extent ...
Numbers
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LIBRIS-ID:oai:research.chalmers.se:0f50ab9c-1c2f-445d-bee6-775f6efb954b
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ISBN:9781424417834
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https://doi.org/10.1109/ISLC.2008.4636006DOI
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https://research.chalmers.se/publication/74862URI
Supplementary language notes
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Language:English
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Summary in:English
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Subject category:kon swepub-publicationtype
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Subject category:ref swepub-contenttype
Notes
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Scanning near-field optical microscopy measurements of the lateral spontaneous emission profile for narrow ridge waveguide 1.3 um GaInNAs-GaAs lasers reveal significant lateral carrier diffusion, which can explain the high characteristic temperature of the threshold current.
Subject headings and genre
Added entries (persons, corporate bodies, meetings, titles ...)
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Wang, Shu Min,1963Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)shumin
(author)
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Sadeghi, Mahdad,1964Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)mahdad
(author)
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Bengtsson, Jörgen,1968Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)jorgenb
(author)
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Larsson, Anders,1957Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)andersla
(author)
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Lim, JunUniversity Of Nottingham
(author)
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Vilokkinen, VilleModulight, Inc.
(author)
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Melanen, P.Modulight, Inc.
(author)
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Chalmers tekniska högskolaUniversity Of Nottingham
(creator_code:org_t)
Related titles
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In:21st IEEE International Semiconductor Laser Conference, ISLC 2008; Sorrento; Italy; 14 September 2008 through 18 September 2008, s. 55-560899-94069781424417834
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