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Interface state properties of high-k/SiOx/Si interfaces portrayed by multiparameter admittance spectroscopy
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- Raeissi, Bahman, 1979 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
- Gutt, T (author)
- Gottlob, H. D. B. (author)
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- Przewlocki, H.M. (author)
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- (creator_code:org_t)
- 2010
- 2010
- English.
- In: Proceedings of the 16th Workshop on Dielectrics in Microelectronics, p. 103, Bratislava, June 28 - 30 2010.
- Conference paper (peer-reviewed)
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- TEKNIK OCH TEKNOLOGIER -- Annan teknik -- Övrig annan teknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Other Engineering and Technologies -- Other Engineering and Technologies not elsewhere specified (hsv//eng)
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