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Thickness measurement of small particles in TEM with EELS, CBED and EFTEM
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- Yao, Yiming, 1957 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Thölén, Anders, 1938 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
- (creator_code:org_t)
- 2002
- 2002
- English.
- In: Proceedings of ICEM-15 Durban 2002, 15th International Congress of Electron Microscopy, Durban South Africa, 1-6 September 2002. ; , s. 469-470
- Conference paper (peer-reviewed)
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- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Annan materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Other Materials Engineering (hsv//eng)
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