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Scanning tunnelling...
Scanning tunnelling microscopy for laterally resolved measurements of magnetoresistance through a point contact
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- Wahlström, Erik, 1970 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Brucas, Rimantas, 1965 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Hanson, Maj, 1939 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 2006
- 2006
- English.
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In: Applied Physics Letters. ; 88, s. 112509-
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Subject headings
- TEKNIK OCH TEKNOLOGIER -- Annan teknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Other Engineering and Technologies (hsv//eng)
Publication and Content Type
- art (subject category)
- ref (subject category)
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