SwePub
Sök i LIBRIS databas

  Extended search

onr:"swepub:oai:research.chalmers.se:1a9559c6-e690-4bf7-a71b-6cd2fa7f45d4"
 

Search: onr:"swepub:oai:research.chalmers.se:1a9559c6-e690-4bf7-a71b-6cd2fa7f45d4" > Express Optical Ana...

  • 1 of 1
  • Previous record
  • Next record
  •    To hitlist

Express Optical Analysis of Epitaxial Graphene on SiC: Impact of Morphology on Quantum Transport

Yager, Thomas, 1987 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Lartsev, Arseniy, 1987 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
Mahashabde, Sumedh, 1985 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
show more...
Charpentier, Sophie, 1983 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
Davidovikj, Dejan, 1988 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
Danilov, Andrey, 1961 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
Yakimova, Rositza (author)
Linköpings universitet,Halvledarmaterial,Tekniska högskolan
Panchal, V. (author)
Royal Holloway University of London,National Physical Laboratory (NPL),National Physical Laboratory, Teddington, UK
Kazakova, O. (author)
National Physical Laboratory (NPL),National Physical Laboratory, Teddington, UK
Tzalenchuk, A.Y. (author)
National Physical Laboratory (NPL),Royal Holloway University of London,National Physical Laboratory, Teddington, UK
Lara Avila, Samuel, 1983 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
Kubatkin, Sergey, 1959 (author)
Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
Yager, Tom (author)
Chalmers University of Technology, Göteborg, Sweden
show less...
 (creator_code:org_t)
2013-08-14
2013
English.
In: Nano Letters. - : American Chemical Society (ACS). - 1530-6992 .- 1530-6984. ; 13:9, s. 4217-4223
  • Journal article (peer-reviewed)
Abstract Subject headings
Close  
  • We show that inspection with an optical microscope allows surprisingly simple and accurate identification of single and multilayer graphene domains in epitaxial graphene on silicon carbide (SiC/G) and is informative about nanoscopic details of the SiC topography, making it ideal for rapid and noninvasive quality control of as-grown SiC/G. As an illustration of the power of the method, we apply it to demonstrate the correlations between graphene morphology and its electronic properties by quantum magneto-transport.

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Nanoteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Nano-technology (hsv//eng)

Keyword

REIBL N
graphene
OPTICS COMMUNICATIONS
LAYER GRAPHENE
SINGLE-LAYER
V49
electron transport
optical microscopy
P6
graphene characterization
PHASE
TRANSISTORS
Epitaxial graphene
SIO2
1984

Publication and Content Type

art (subject category)
ref (subject category)

Find in a library

To the university's database

  • 1 of 1
  • Previous record
  • Next record
  •    To hitlist

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.

 
pil uppåt Close

Copy and save the link in order to return to this view