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Express Optical Ana...
Express Optical Analysis of Epitaxial Graphene on SiC: Impact of Morphology on Quantum Transport
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- Yager, Thomas, 1987 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Lartsev, Arseniy, 1987 (author)
- Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
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- Mahashabde, Sumedh, 1985 (author)
- Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
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- Charpentier, Sophie, 1983 (author)
- Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
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- Davidovikj, Dejan, 1988 (author)
- Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
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- Danilov, Andrey, 1961 (author)
- Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
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- Yakimova, Rositza (author)
- Linköpings universitet,Halvledarmaterial,Tekniska högskolan
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- Panchal, V. (author)
- Royal Holloway University of London,National Physical Laboratory (NPL),National Physical Laboratory, Teddington, UK
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- Kazakova, O. (author)
- National Physical Laboratory (NPL),National Physical Laboratory, Teddington, UK
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- Tzalenchuk, A.Y. (author)
- National Physical Laboratory (NPL),Royal Holloway University of London,National Physical Laboratory, Teddington, UK
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- Lara Avila, Samuel, 1983 (author)
- Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
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- Kubatkin, Sergey, 1959 (author)
- Chalmers tekniska högskola,Chalmers University of Technology,Chalmers University of Technology, Göteborg, Sweden
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- Yager, Tom (author)
- Chalmers University of Technology, Göteborg, Sweden
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(creator_code:org_t)
- 2013-08-14
- 2013
- English.
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In: Nano Letters. - : American Chemical Society (ACS). - 1530-6992 .- 1530-6984. ; 13:9, s. 4217-4223
- Related links:
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http://dx.doi.org/10...
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https://doi.org/10.1...
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Abstract
Subject headings
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- We show that inspection with an optical microscope allows surprisingly simple and accurate identification of single and multilayer graphene domains in epitaxial graphene on silicon carbide (SiC/G) and is informative about nanoscopic details of the SiC topography, making it ideal for rapid and noninvasive quality control of as-grown SiC/G. As an illustration of the power of the method, we apply it to demonstrate the correlations between graphene morphology and its electronic properties by quantum magneto-transport.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Nanoteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Nano-technology (hsv//eng)
Keyword
- REIBL N
- graphene
- OPTICS COMMUNICATIONS
- LAYER GRAPHENE
- SINGLE-LAYER
- V49
- electron transport
- optical microscopy
- P6
- graphene characterization
- PHASE
- TRANSISTORS
- Epitaxial graphene
- SIO2
- 1984
Publication and Content Type
- art (subject category)
- ref (subject category)
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- By the author/editor
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Yager, Thomas, 1 ...
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Lartsev, Arseniy ...
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Mahashabde, Sume ...
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Charpentier, Sop ...
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Davidovikj, Deja ...
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Danilov, Andrey, ...
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show more...
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Yakimova, Rositz ...
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Panchal, V.
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Kazakova, O.
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Tzalenchuk, A.Y.
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Lara Avila, Samu ...
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Kubatkin, Sergey ...
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Yager, Tom
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- About the subject
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Nano technology
- Articles in the publication
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Nano Letters
- By the university
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Chalmers University of Technology
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Linköping University