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0.5 Tbit/s eye-diag...
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Li, Jie,1966Chalmers tekniska högskola,Chalmers University of Technology
(author)
0.5 Tbit/s eye-diagram measurement by optical sampling using XPM-induced wavelength shifting in highly nonlinear fiber
- Article/chapterEnglish2003
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LIBRIS-ID:oai:research.chalmers.se:24734042-de46-4cc0-a622-50f6695e064e
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https://research.chalmers.se/publication/211006URI
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Subject category:kon swepub-publicationtype
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Subject category:ref swepub-contenttype
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Westlund, Mathias,1975Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)f95mawe
(author)
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Sunnerud, Henrik,1971Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)sunnerud
(author)
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Olsson, Bengt-Erik,1968Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)beol
(author)
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Karlsson, Magnus,1967Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)magkar
(author)
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Andrekson, Peter,1960Chalmers tekniska högskola,Chalmers University of Technology(Swepub:cth)andrekso
(author)
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Chalmers tekniska högskola
(creator_code:org_t)
Related titles
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In:Proc. European Conference on Optical Communication (ECOC'03), s. Mo4.6.4-
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