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Electrical properti...
Electrical properties of LaLuO3/Si(100) structures prepared by molecular beam deposition
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- Gomeniuk, Y. Y (author)
- National Academy of Sciences in Ukraine
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- Gomieniuk, Y. V. (author)
- National Academy of Sciences in Ukraine
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- Nazarov, A. N. (author)
- National Academy of Sciences in Ukraine
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- Raeissi, Bahman, 1979 (author)
- Tyndall National Institute at National University of Ireland, Cork
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- Cherkaoui, K. (author)
- Tyndall National Institute at National University of Ireland, Cork
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- Monaghan, S (author)
- Tyndall National Institute at National University of Ireland, Cork
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Gottlob, H. D. B. (author)
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Schmidt, M. (author)
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- Schubert, J. (author)
- Forschungszentrum Jülich GmbH
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- Lopes, J.M.J (author)
- Forschungszentrum Jülich GmbH
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- Engström, Olof, 1943 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- ISBN 9781566778220
- The Electrochemical Society, 2010
- 2010
- English.
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In: ECS Transactions. - : The Electrochemical Society. - 1938-5862 .- 1938-6737. - 9781566778220 ; 33:3, s. 221-227
- Related links:
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http://dx.doi.org/10...
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Abstract
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- The paper presents the results of electrical characterization in the wide temperature range (120-320 K) of the interface and bulk properties of high-k LaLuO3 dielectric deposited by molecular beam deposition (MBD) on silicon substrate. The energy distribution of interface state density is presented and typical maxima of 1.2×1011 and 2.5×10 11 eV-1 cm-2 were found at about 0.25-0.3 eV from the silicon valence band. The charge carrier transport through the dielectric at the forward bias was found to occur via Poole-Frenkel mechanism, while variable range hopping conduction (Mott's law) controls the current at the reverse bias.
Subject headings
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
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- kon (subject category)
- ref (subject category)
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- By the author/editor
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Gomeniuk, Y. Y
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Gomieniuk, Y. V.
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Nazarov, A. N.
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Raeissi, Bahman, ...
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Cherkaoui, K.
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Monaghan, S
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show more...
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Gottlob, H. D. B ...
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Schmidt, M.
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Schubert, J.
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Lopes, J.M.J
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Engström, Olof, ...
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- About the subject
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- ENGINEERING AND TECHNOLOGY
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ENGINEERING AND ...
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and Electrical Engin ...
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and Other Electrical ...
- Articles in the publication
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ECS Transactions
- By the university
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Chalmers University of Technology